The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 1995
Filed:
Jul. 26, 1994
Kexin Xu, Kyoto, JP;
Yutaka Yamasaki, Kyoto, JP;
Harumi Uenoyama, Kyoto, JP;
Takeshi Sakura, Kyoto, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Abstract
An apparatus and method for measuring component concentrations which enables accurate measurement of concentrations of component within an object in a non-destructive, non-invasive, and bloodless procedure. The apparatus comprises a light irradiator 1 for projecting pulse laser of different wavelengths toward an object 12 by means of a variable wavelength laser generating unit 11, a photodetector 2 for performing a time resolved measurement of the quantity of transmitted light from the object which is subject to changes with lapse of time after the generation of the pulse laser, and an arithmetic unit 3 for calculating concentrations of components in the object 12 and outputting the calculation result such that the relationship between time lapse and measured quantity of light is converted into a relationship between an optical path length representing the distance of light travel within the object 12 and a change in the measured quantity of light relative to a change in unit concentration so that the optical path length and the quantity of light which is measured when the change in the quantity of light is at a peak are stored in memory for each wavelength, the quantity of light being used as a basis for the calculation.