The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 1995
Filed:
May. 16, 1995
Steven E Nelson, Mountain View, CA (US);
Robert A Street, Palo Alto, CA (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A radiation imaging method and system for use in various imaging techniques includes a source of radiation at first and second wavelengths. A first radiation target array receives the radiation from the first wavelength at first spacial locations to produce an array of output signals at locations within the first radiation target array related to the magnitude of the radiation at each of the first spacial locations. A second radiation target array receives the radiation at the second wavelength at second spacial locations to produce an array of output signals at locations within the second radiation target array related to the magnitude of the radiation at each of the second spacial locations. The first and second outputs are combined to produce combined image signals that has increased contrast from that which would be produced by either the first or the second output alone. In a preferred embodiment, the first and second radiation target arrays comprise amorphous silicon arrays in which sensor data from the first and second radiation targets is synchronously clocked from the array.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile