The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 1995

Filed:

Apr. 11, 1995
Applicant:
Inventors:

Yoshinori Honguh, Yokohama, JP;

Toyoki Taguchi, Yokohama, JP;

Hiroshi Hasegawa, Kawasaki, JP;

Tadashi Kobayashi, Chiba, JP;

Naoki Morishita, Yokohama, JP;

Naomasa Nakamura, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B / ;
U.S. Cl.
CPC ...
428 646 ; 428913 ; 428 651 ; 369100 ; 369121 ; 430270 ; 430945 ;
Abstract

An optical recording medium comprises a transparent substrate, an inner protection layer, a recording material layer, an outer protection layer, and a reflection layer, which are laminated in this order. In an in-groove recording mode, the ratio of the thickness of the recording material layer to the thickness of the outer protection layer is in a range between 0.52 and 0.95. In an on-land recording mode, the ratio of the thickness of the recording material layer to the thickness of the outer protection layer is in a range between 0.32 and 0.6.


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