The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 1995
Filed:
Sep. 11, 1992
Edward J Szczebak, Jr, Plano, TX (US);
Chris A Balthrop, Sr, Dallas, TX (US);
Patricia K Mutzabaugh, Garland, TX (US);
John M Porter, Fort Worth, TX (US);
Gary D Stewart, Dallas, TX (US);
Reliance Comm/Tec Corporation, Bedford, TX (US);
Abstract
A processor controlled test set is disclosed for testing special service circuits of a telecommunication system. A microprocessor controls the overall operation of the test set, while a digital signal processor provides high speed timing signals to the various test circuits for generating the wave forms used in testing, as well as analyzes the test result signals that are converted into digital signals. A calibration of the test generator signals as well as the signal measuring path is carried out prior to the test sequence. The digital signal processor also provides gain control over a talking path to maintain stability thereof. An I/O circuit of the test set provides plural communication paths between remote equipment and the test set to initiate and carry out various tests. Processors in the I/O module are effective to convert the various protocols of the serial data, by way of software, to digital bit streams usable by the test set.