The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 1995
Filed:
May. 01, 1992
Peter J Klopotek, Framingham, MA (US);
Summit Technology, Inc., Waltham, MA (US);
Abstract
The invention is a system and method of measuring the shape of a surface. The corneal topographer specifically shown comprises a transparent rigid reference member having a reference surface of a predetermined shape, a conformable substance capable of assuming the conformation of surfaces being pressed against, a light source for irradiating the conformable substance pressed between the reference surface and the corneal surface, and a detection system for detecting light propagating from the reference member and carrying information about the thickness. Two specific designs are shown, both based on differential topography. The first design uses a fluorescent conformable substance which fills the space between the reference surface and the corneal surface. The local intensity of fluorescent radiation detected by the detection system is correlated to the local thickness of the fluorescent conformable substance. The second design utilizes an absorbing conformable substance with a diffusive reflecting surface forming the section of the conformable substance pressed against the corneal surface during the measurement process. The local thickness of the absorbing conformable substance is determined from the amount of light locally absorbed. A topographer of the first or the second design can be used to measure the topography of the surface of a solid object of various constructions without regard to the finish of the surface, e.g., specular reflective, diffusely reflective or non-reflective.