The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
May. 17, 1993
Koji Okumoto, Tokyo, JP;
Katsumi Matsuno, Kanagawa, JP;
Toru Shiono, Tokyo, JP;
Toshitaka Senuma, Tokyo, JP;
Tokuya Fukuda, Tokyo, JP;
Shinji Takada, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A method of testing an electronic apparatus which eliminates a control signal line for setting an integrated circuit to a test mode and a test mode select terminal of an external terminal section and wherein fetching of test data and transfer of the thus fetched test data are performed in an integrated operation. In each of the integrated circuits, a boundary scan control circuit discriminates a category code at the top of data inputted from a serial input terminal to control a pair of switching circuits. When the category code represents a test mode, predetermined terminals of the switching circuits are selected so that input data are sent out to boundary scan cells. Fetching of parallel data from parallel input terminals and transfer to the boundary scan cells are performed at a time.