The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
Apr. 22, 1993
Applicant:
Inventor:
Jei-Hwan You, Kyungki, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon, KR;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; C11C / ;
U.S. Cl.
CPC ...
371 212 ; 371 211 ; 371 681 ; 365201 ;
Abstract
A parallel test circuit is provided in a semiconductor memory chip for use during both a wafer test and a package test. The parallel test circuit operates to automatically reduce the number of test output pins associated with a single package test to thereby increase the number of packages that can be tested simultaneously. The parallel test circuit includes a selector for limiting the number of output pads which may be activated during a package test run. The selector is responsive to a wafer test enable signal, from a selection control circuit, to control output pad selection.