The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
Mar. 23, 1993
Carl Zeiss-Stiftung, Oberkochen, DE;
Abstract
For rapid measurement of workpieces having elemental shapes of known geometry in any orientation in space, the elemental shapes are scanned on a coordinate measuring machine which is equipped with a measuring probe head having a permissible measurement range (MR). The computer of the measuring machine is programmed with basic data for establishing a predetermined path of probe-scanning contact with the workpiece, the predetermined path being so calculated (1) that the probe ball of the probe will remain in continuous contact with the workpiece surface, (2) that probe-head measurements always occur within the permissible measurement range (MR) of the probe head, and (3) that probe-ball displacements reflect probe-head measurements that are taken as measured corrections of the predetermined path. The control system of the coordinate measuring machine monitors the permissible measurement range (MR) of the probe head and corrects for such bending of the probe pin as may occur in the course of scanning along the predetermined path.