The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
Jul. 01, 1993
Nicholas C Talbot, Cupertino, CA (US);
Mark Nichols, Sunnyvale, CA (US);
Trimble Navigation Limited, Sunnyvale, CA (US);
Abstract
Apparatus for measuring surveying parameters, such as distances and angular displacements between survey stations, with improved accuracy. The invention combines a differential satellite positioning system (SATPS), available with positioning systems such as GPS and GLONASS, with electromagnetic measurements of distances and optically encoded angles by a conventional electro-optical survey instrument to provide survey measurements that can be accurate to within a few millimeters in favorable situations. The differential satellite positioning system relies upon carrier phase measurements, after removal of certain phase integer ambiguities associated with carrier phase SATPS signals. The SATPS may be retrofitted within the housing of the conventional electro-optical instrument.