The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
Jan. 27, 1993
Kazuo Nakagawa, Tokyo, JP;
Yuichi Iritani, Tokyo, JP;
Hiromi Yamazaki, Tokyo, JP;
Yasushi Takakuwa, Tokyo, JP;
Nikkiso Co., Ltd., Tokyo, JP;
Abstract
The invention provides an anesthesia monitor being able to directly make a separation and a determination in real time all components of a gas in which components having the same integer molecular weight exists, more particularly an expiration gas and an inspiration gas as the object of analysis. The monitor has a small size, a low price and a operational facility. A microscopic quantity of the expiration gas is introduced from a circular route of an anesthesia circuit for an inhalation anesthesia to the anesthesia monitor through a material pipe-line. A gas portion is transmitted by a rotary pump through valves and opening and closing valves to a measurement cell within a vacuum chamber arranged in a gap of between magnetic poles of permanent magnets in a Fourier transformation mass analyzer so that the expiration gas is subjected to a high speed sampling. An ionization of the ions is carried out within the measurement cell. A cyclotron resonance is caused thereby causing a high frequency voltage which is received by receiving electrodes of the cell. After a digiterzation of the signals, a computer executes a Fourier transformation mass analyzing process.