The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1995
Filed:
May. 02, 1994
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 67 ; 422 63 ; 422 64 ; 422 70 ; 422 73 ; 436 43 ; 436 47 ; 436 48 ; 436 50 ; 436 55 ;
Abstract
In a first measurement stage, reaction solutions of samples are optically measured by a biochemical analyzer, and the measurement result of the analysis item which is an index of the disease status regarding the samples is compared with the check index. This check index is stored in memory beforehand. When the measurement result corresponds to the check index, the sample processing goes to a second measurement stage for measuring a specific item. In the second measurement stage, the sample is measured by an immuno-assay apparatus or a nucleic acid analyzer, and the measurement result is outputted.