The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1995

Filed:

Nov. 08, 1993
Applicant:
Inventors:

Hui Hu, Waukesha, WI (US);

Norbert J Pelc, Los Altos, CA (US);

Armin H Pfoh, New Berlin, WI (US);

Assignee:

General Electric Company, Waukesha, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ;
U.S. Cl.
CPC ...
378-4 ; 378901 ; 36441317 ;
Abstract

An x-ray computed tomography system for helically scanning a patient translates the patient as projections of the patient at various beam angles are obtained. The projection data are weighted prior to reconstruction to account for multiply measured projection data and the deviation of the cone beam from a parallel beam approximation.


Find Patent Forward Citations

Hu, Hui. (1995). Projection domain reconstruction method for helical scanning computed (U.S. Patent No. 5469486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5469486

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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