The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1995

Filed:

May. 08, 1991
Applicant:
Inventors:

Herman Polich, Monument, CO (US);

James Nicholson, Colorado Springs, CO (US);

Larry Emlich, Colorado Springs, CO (US);

Assignee:

Digital Equipment Corporation, Maynard, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
39518218 ; 39518302 ;
Abstract

An expert system for determining the likelihood of failure of a unit in a computer system. The operating system of the computer system maintains a log of the errors occurring for each unit in the computer system. If a predetermine number of errors have been entered in the log for a specific unit, the expert system retrieves the error entries relating to that unit and processes them to determine whether a failure is likely to occur. In this, the processing performed by the expert system is arranged so that tests relating to components of increasing particularity, and decreasing generality, are performed after the tests relating to more general components.


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Polich, Herman. (1995). Expert system for identifying likely failure points in a digital data (U.S. Patent No. 5469463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5469463

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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