The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1995

Filed:

Jun. 20, 1994
Applicant:
Inventors:

Nachappa Gopalsami, Naperville, IL (US);

Sasan Bakhtiari, Bolingbrook, IL (US);

Apostolos C Raptis, Downers Grove, IL (US);

Stephen L Dieckman, Downers Grove, IL (US);

Assignee:

The University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250393 ; 2503361 ;
Abstract

A millimeter-wave sensor for detecting and measuring effluents from processing plants either remotely or on-site includes a high frequency signal source for transmitting frequency-modulated continuous waves in the millimeter or submillimeter range with a wide sweep capability and a computer-controlled detector for detecting a plurality of species of effluents on a real time basis. A high resolution spectrum of an effluent, or effluents, is generated by a deconvolution of the measured spectra resulting in a narrowing of the line widths by 2 or 3 orders of magnitude as compared with the pressure broadened spectra detected at atmospheric pressure for improved spectral specificity and measurement sensitivity. The sensor is particularly adapted for remote monitoring such as where access is limited or sensor cost restricts multiple sensors as well as for large area monitoring under nearly all weather conditions.


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