The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 1995
Filed:
Apr. 10, 1995
Takao Hyoguchi, Sagamihara, JP;
Katsuhiro Kawashima, Sagamihara, JP;
Nippon Steel Corporation, Tokyo, JP;
Abstract
A method for measuring properties of a cold rolled thin steel sheet, comprising the determination, by using a resonant electromagnetic ultrasonic wave sensor for a standing wave, of the ratio of a thickness resonant frequency of a transverse ultrasonic wave propagating within a cold rolled thin steel sheet in the direction of thickness while polarized in a direction parallel to the direction of rolling to a thickness resonant frequency of a longitudinal ultrasonic wave propagating within the cold rolled thin steel sheet in the direction of thickness, and the ratio of a resonant frequency of a transverse ultrasonic wave propagating within the cold rolled thin steel sheet in the direction of thickness while polarized in a direction normal to the direction of rolling to a thickness resonant frequency of a longitudinal ultrasonic wave propagating in the direction of thickness, and approximately determining the Young's modulus and the Lankford value according to a computing formula using the resultant two measured -ratio values, the sound speed ratio of a SH0 plate wave regarded as a constant value and a known value of modulus of elasticity; and an apparatus for measuring properties of a cold rolled thin steel sheet comprising an electromagnetic ultrasonic wave device, a computing device and a controlling device for executing the measurement of properties and the computation.