The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 1995
Filed:
Sep. 07, 1993
Applicant:
Inventors:
Masato Sakao, Tokyo, JP;
Shuichi Ohya, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ; H01L / ;
U.S. Cl.
CPC ...
257532 ; 257310 ; 361313 ;
Abstract
In a semiconductor device having a first insulator layer on a semiconductor substrate and accumulation electrode layers overlying the first insulator layer, second insulator layers overlie predetermined areas of the first insulator layer and side electrode surfaces of the accumulation electrode layers. Each of the second insulator layers has a primary dielectric constant. A dielectric layer overlies upper surfaces of the accumulation electrode layers and the second insulator layers and has a secondary dielectric constant which is higher than the primary dielectric constant. An opposed electrode layer overlies the dielectric layer.