The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 1995
Filed:
Oct. 13, 1993
Theodore B Ladewski, Ann Arbor, MI (US);
KMS Fusion, Inc., Ann Arbor, MI (US);
Abstract
A method and system for gauging deviations of a surface of a specular surfaced test object from a preselected nominal surface profile utilizes electromagnetic radiation that is directed towards a direction altering means and through an attenuating medium onto the reflective surface of the test object. An image sensor such as a camera is positioned to receive an image of the radiation reflected by the test object surface back through the attenuating layer, with the Intensity of such radiation varying across the image as a function of the deviation of the test Object surface from the nominal surface profile. The sensor output is digitized to form a set of digital signals indicative of the intensity of radiation associated with each location of the reflected image, and the digitized signals are stored in digital electronic memory and/or displayed on a screen. Methods for correcting optically generated errors in the image are disclosed that, together with the gauging system, provide a quantitative measurement of the deviations in test surface profile from a preselected profile over the entire surface being measured.