The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 1995

Filed:

Jun. 03, 1994
Applicant:
Inventors:

Steve Bilodeau, Setauket, NY (US);

Frank Jacovino, Plainview, NY (US);

Joanne Cameron, Oakdale, NY (US);

James Cain, Calverton, NY (US);

Assignee:

Robotic Vision Systems, Inc., Hauppauge, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356371 ; 356237 ;
Abstract

A method for determining coplanarity with 3-D sensing means of substrates for ball grid array, column grid array, and similar surface mount integrated circuit chips, in which opaque fiducials are provided as index pads. Heights of the index pads are correlated with signal pad heights in a neighborhood about the index pads. The index pads are opaque to incident radiation from the 3-D sensor. The index pads reflect sufficient radiation to be detected easily by the 3-D sensor. The index pads are disposed in a prearranged pattern over a domain of ball grid array signal pads. The index pads are restricted to a predetermined range of heights.


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