The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1995
Filed:
Jan. 18, 1994
Robert F Kantner, Jr, Boca Raton, FL (US);
Vaughn S Iverson, Seattle, WA (US);
Kenneth Morse, South Hampton, GB;
Mark A Pietras, Boynton Beach, FL (US);
Arturo A Rodriguez, Belmont, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed is a system and a method for compressing digitized color video data by generating codes into a pattern of tables for regions in frames of the video data exhibiting certain patterns. An image frame in a video data stream has a plurality of pixels assigned digitized color and luminance data. The image frame is divided into a plurality of non-overlapping elementary units, with each elementary unit comprising a plurality of pixels. For elementary units exhibiting change from the prior frame in time, elementary units having pixels with differing digitized color and luminance data are selected for pattern matching. Each pixel of an elementary unit selected for pattern matching is mapped to a pattern value. A pattern value is the same for all pixels sharing the same color and luminance data in an elementary unit. The pattern values are then grouped based on relative position in the elementary unit into offsets into associated sets of pattern match tables and error condition tables. The pattern match tables and error condition tables all relate to a single table of patterns. Entries from the offsets into each associated set of pattern match and error condition tables are then accumulated to generate indicia of pattern matches. The indicia are then compared to select a pattern which best matches the elementary unit within a preselected error tolerance. An offset into a table of patterns for the matched pattern is then generated to provide the desired code.