The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1995
Filed:
Jun. 27, 1994
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
Method of detecting and evaluating analog photometric signals in a test carrier analysis system, and apparatus for carrying out the method. The test field of a test carrier is irradiated by a light source clocked in light-dark phases. The reflected light is detected by a measurement receiver over a measurement period having several light-dark phases, and integrated. An effective suppression of stray and secondary light, which permits measurement even without the hitherto conventional shielding from ambient light, is achieved by a method in which the sequence of the light and dark phases integrated over the measurement period is irregular in such a way that the Fourier-transformed frequency spectrum includes a large number of different frequencies. Each individual frequency therefore makes only a small contribution to the measurement result.