The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1995
Filed:
Sep. 16, 1994
Takeshi Suzuki, Tokyo, JP;
Akihiro Sugiyama, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A perimeter capable of objectively adding useful testing points without relying on an operator's intuitional judgment, and capable of performing a reliable test of the field of vision without imposing a useless burden on a subject. The perimeter includes a CPU 11 and a display portion 18. The CPU 11 forms data, which include estimated values, on a visual field characteristic distribution by making an interpolation between tested values of a subject's eye which are obtained by exhibiting a plurality of targets. The display portion 18 displays an unreliable distribution WP indicating a domain estimated to be distant from the tested values on the basis of data on the visual field characteristic distribution and data, which include the tested values, on a distribution of an estimated neighborhood of the tested values.