The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1995
Filed:
Jul. 29, 1993
Nidek Co., Ltd., Aichi, JP;
Abstract
An examination apparatus for examining an object having a spheroidal reflecting surface provides a first index projecting optical system for projecting a first measuring index onto the object to be examined at a designated angle, a second index projecting optical system for projecting a second measuring index having a different optical distance from the first index onto the object at the designated angle, so that each reflected images of the first and second measuring index have a designated image height relationship therebetween when the object is placed at a designated working distance, and respective image height of reflected images of the first and second measuring index are detected by a detecting optical system with a photoelectric conversion apparatus, whereby whether the working distance between the object and the apparatus is right or not is judged by processing a signal detected by the photoelectric conversion apparatus.