The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1995
Filed:
Jun. 15, 1993
Applicant:
Inventors:
James W Grace, Los Altos Hills, CA (US);
David M DiPietro, San Jose, CA (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241581 ; 324 731 ; 324115 ;
Abstract
Pin electronics for an IC tester are built as an integrated circuit for testing the electrical operation of a device under test (DUT) by applying a test voltage to each of the pins on the DUT and measuring each resulting current. Typically, when the tester switches between the internal measure resistors, a voltage spike occurs on the pin of the DUT of a magnitude that may severely damage the sensitive circuitry on the DUT. Voltage spike suppression is included in the circuitry to minimize the effects on the DUT of voltage spikes.