The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 1995

Filed:

Sep. 15, 1993
Applicant:
Inventors:

Miki Kurosawa, Aichi, JP;

Shuji Ogawa, Aichi, JP;

Masayuki Sugahara, Aichi, JP;

Kiyoshi Funai, Hyogo, JP;

Takashi Yumura, Hyogo, JP;

Tetsu Yamamoto, Hyogo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B23K / ;
U.S. Cl.
CPC ...
21912183 ; 21912162 ; 372 29 ;
Abstract

A method and apparatus for detecting the machining status of a laser beam machining device, having a multi-mirror resonator for generating a machining beam, which utilizes the secondary light generated by the machining operation and returned from the workpiece surface into the resonator for control of the machining operation. The oscillator and accompanying components, such as beam dividing mirrors and splitters, are operative to separate the secondary light from the laser beam within the resonator and direct the two beams separately to detectors located outside of the resonator. Alternatively, the secondary light and laser beam may be directed to the outside together where they are separated by an integrating sphere for detection.


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