The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 1995

Filed:

Jun. 10, 1994
Applicant:
Inventors:

Daniel T Wang, Jacksonville, FL (US);

Lars W Johnson, Indialantic, FL (US);

John M Lepper, Jacksonville, FL (US);

Wallace A Martin, Orange Park, FL (US);

Leonard R Reinhart, Melbourne, FL (US);

Ravi S Sanka, Jacksonville, FL (US);

Craig W Walker, Jacksonville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364468 ; 364131 ; 36455101 ; 364552 ;
Abstract

A computer control system for optimizing process parameters in an automated production line for producing contact lenses. The system comprises a plurality of process controllers for controlling one or more process stations of the production line, each of the controllers regulating a plurality of process control devices that each control specific production parameters used in the automated manufacture of contact lenses at the process station(s). An automated lens inspection device automatically evaluates each contact lens produced and generates inspection data for each contact lens, and a polling device polls each of the process controllers on a frequent basis to acquire process control data for each period. Further included is a correlating device for correlating the inspection data to the process control data and the contact lens data to optimize process parameters used in the production of contact lenses. A relational database is also provided for storing the process control data, the contact lens data and the inspection data received from the correlating device.


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