The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 1995

Filed:

Feb. 02, 1994
Applicant:
Inventors:

Jeremy Lerner, Culver City, CA (US);

Taiwei Lu, Torrance, CA (US);

Shing-Hong F Lin, Torrance, CA (US);

Andrew Kostrzewski, Garden Grove, CA (US);

Hung Chou, Garden Grove, CA (US);

Assignee:

Physical Optics Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356300 ; 356303 ; 356326 ;
Abstract

Apparatus for analyzing a spectral signature, including: a light source; a spatial light modulator connected to the light source, the spatial light modulator modulating light from the light source in accordance with spatial features of the spectral signature; an optic system upon which modulated light from the spatial light modulator is incident, the optic system filtering the modulated light; a hologram illuminated with filtered, modulated light from the optic system, the hologram outputting an optical identification of the spectral signature; and a detector upon which the optical identification is incident, the detector detecting the optical identification.


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