The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 1995
Filed:
Feb. 25, 1993
Blake F Woith, Orange, CA (US);
John S Szalay, Corona Del Mar, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
A test probe including a flexible membrane (12) having an array of test probe contacts (14) capable of softly and gently contacting pads on a device under test is provided with a structure that effectively applies tension to the membrane while at the same time automatically leveling the membrane and removing distortions. A small pressure plate (30) is bonded to the inner surface of the membrane behind the test probe contacts. A pressure post (58) having a pointed or rounded end (64) is pressed against the pressure plate (30a) and makes pivotal contact with the plate. A spring (50) including an adjustment screw (56) that axially adjusts the compression of the spring, applies pressure through the pivot point to the pressure plate and thus to the membrane at its test probe contacts. When the probe contacts (14) are pressed against a device to be tested, the probe contacts and pressure plate (30) rotate about the pivot point (64) of the pressure post (58), and thereby both planarize the test probe contact array (14 ) and level the test contact array while appropriately tensioning the membrane.