The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1995

Filed:

Nov. 23, 1992
Applicant:
Inventors:

John S Best, San Jose, CA (US);

Steven R Hetzler, Sunnyvale, CA (US);

Roger F Hoyt, San Jose, CA (US);

Jaishankar M Menon, San Jose, CA (US);

Michael F Mitoma, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
395441 ; 395438 ; 395439 ; 3642663 ; 36493148 ; 3649571 ; 3649663 ; 364D / ; 364D / ; 371 511 ;
Abstract

A method for operating a synchronized array of fixed block (FBA) formatted Direct Access Storage Devices (DASDs) to store and update variable-length (CKD) formatted records. This method is suitable for use with DASDs that obtain high recording density by using read and write head technology requiring 'micro-jogging' to adjust for differing read and write head alignment or banded disk architecture having a higher block count in the outer tracks than in the inner tracks. Magneto-resistive heads may require micro-jogging to realign the write head for recording after reading the physical track location. The invention employs a DASD staggered array architecture having logical tracks consisting of diagonal-major sequences of consecutive blocks arranged in a predetermined wrap-around manner such as a topological cylinder or torus. The minimum necessary number of DASDs (N) in the staggered array is limited by the fixed block size (B), the interblock gap size (G), the average DASD data transfer rate (D), and the micro-jog delay time (T). A (N+1).sup.th DASD may be added to record the parity of each diagonal-major sequence for improved fault-tolerance.


Find Patent Forward Citations

Loading…