The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 1995
Filed:
Aug. 08, 1994
Reijiro Tsuchiya, Sagamihara, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An evaluation system for a signal waveform includes a first delay element for delaying a clock signal, a second delay element for delaying the output of the first delay element, and third and fourth delay elements for delaying the output of the second delay element. A first detector receives the output of the first delay element and the signal waveform for outputting binary data, a second detector receives the output of the second delay element and the signal waveform for outputting binary data, a third detector receives the output of the third delay element and the signal waveform for outputting binary data, and first, second and third shift registers receive output data of the first, second and third detectors and the output of the fourth delay element. A comparator unit compares data in the first, second and third shift register with a particular data pattern, and a counter counts output pulses of the comparator unit, the output of the second detector being output as a read data output. The distribution of peak pulses in a detection window is thereby determined.