The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1995

Filed:

May. 17, 1994
Applicant:
Inventors:

Yoon C Park, Daejon, KR;

Seung W Kim, Daejon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356374 ; 2502 / ;
Abstract

The present invention provides an apparatus and method for measuring two- dimensional displacement by moire fringes of concentric circle gratings which two-dimensional displacement can be precisely measured by a pair of grating and the measurement resolution can be improved by the image processing using the characteristics of moire fringes without noises.


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