The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1995

Filed:

Jun. 29, 1994
Applicant:
Inventor:

Oren Aharon, Haifa, IL;

Assignee:

Duma Optronics, Ltd., Nesher, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356121 ;
Abstract

A light or laser beam analyzer uses a rotating drum with circumferential knife-edges or slits that interrupt the beam. Inside the drum is a light intensity detector, connected to a processor which reconstructs the beam waist parameters based upon the cut profiles. The knife-edges or slits are disposed at three or more different angles to the drum rotation axis. An attenuation filter is removably mounted inside the drum, where it introduces no distortion into the light measurement. The beam is diverted from the beam line and brought to the drum by a retro-reflector which is slidably mounted along a track parallel to the beam line. The folded path allows the use of a long-focal length lens such as a simple plano-convex type. The lens is demountable for making direct measurements, and an opening is provided in the drum for passing the unfocused beam through onto the detector.


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