The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 1995

Filed:

Aug. 20, 1993
Applicant:
Inventors:

Jerold A Seitchik, Dallas, TX (US);

Thomas J Aton, Dallas, TX (US);

Scott D Jantz, Jacksonville, FL (US);

Assignee:

Texas Instruments Inc., Dallas, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364487 ; 324 7624 ; 324 7635 ; 324532 ; 364481 ;
Abstract

A flash waveform analyzer (10) includes a transmission line (12) for propagating a signal from an input (14). The transmission line (12) contains a plurality of samplers (16) located at different points along the transmission line (12). Each sampler (16) is activated by a strobe pulse from a strobe source (18) in order to measure a characteristic of the signal at the different points along the transmission line (12). The propagation velocity of the signal is made slower than the propagation velocity of the strobe pulse by using a different dielectric constant in the transmission line (12) than that of the strobe delay line (17). The characteristic measured by each sampler (16) is sent to a multiplexer (20) that selectively outputs the measured characteristic from each sampler (16) to an analog-to-digital converter (22) for processing and subsequent analysis.


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