The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 1995

Filed:

Jun. 10, 1994
Applicant:
Inventor:

Stephen K Wilcken, Grants Pass, OR (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356354 ; 356345 ; 356359 ;
Abstract

A split-path point-diffraction interferometer (SPPDI) comprising separate signal and reference beam paths is disclosed. A beamsplitter is used to divide a linearly polarized converging incident signal beam into separate signal and reference beam paths prior to focus. The reference beam path comprises a diffracting aperture located at the focal point of the signal beam. The diffracting aperture in the reference beam path produces an expanding, diffraction-limited reference wavefront. The signal and reference beam paths comprise linear polarizers whose yaw, pitch, and roll orientation may be freely adjusted. Yaw and pitch adjustment of one or more linear polarizers provides for adjustment of fringe spacing and orientation. Roll adjustment of one or more linear polarizers provides for adjustment of fringe contrast and intensity. Beam turning mirrors are used to direct the signal and reference beams to a beam combiner. Polarizing analysers are placed in the combined output beams produced by the beam combiner. A double-pass embodiment of an SPPDI comprising a beam splitter and compact laser source is disclosed.


Find Patent Forward Citations

Wilcken, Stephen. (1995). Point-diffraction interferometer utilizing separate reference and signal (U.S. Patent No. 5457533). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5457533

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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