The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 1995

Filed:

Apr. 23, 1993
Applicant:
Inventors:

Yi Liu, Acton, MA (US);

Lawrence C Lynnworth, Waltham, MA (US);

Assignee:

Panametrics, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
73597 ; 7329 / ; 73 6179 ; 73 6453 ; 7386118 ;
Abstract

A sensing system detects elastic waves propagated along a sensing path in a sheet to detect a characteristic of material contacting the other side of the sheet. An acoustic load applied between transducers discriminates characteristics in diverse environments. Different systems detect density, stiffness, presence, degree of coupling, thickness, or fill height of the material, with applications to areas as diverse as aircraft wing ice measurement, storage tank fill height detection, and mass flow detection. In one preferred embodiment a protective housing covers and protects the first side of the sheet over a region of the sheet encompassing the sensing path, and may secure transducers in defined positions. The housing preferably defines a closed reservoir that is temporarily filled to determine a normative measurement such as transit time or change in phase velocity. The normative measurement provides an empirical calibration that, in turn, allows a final parameter or a detection threshold to be precisely determined.


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