The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 1995

Filed:

Aug. 23, 1994
Applicant:
Inventor:

John M Hawes, Appleton, WI (US);

Assignee:

Albany International Corp., Albany, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D03D / ;
U.S. Cl.
CPC ...
1393 / ;
Abstract

A triple-layer papermaking fabric includes top and a bottom weft yarn layers interwoven with a system of warp yarns. The warp yarn system includes pairs of associated, stacked first and second warp yarns. The first warp yarn in each pair interweaves with the top weft yarns in a plain-weave pattern occasionally broken by an interweaving with a bottom weft yarn to join the top and bottom weft yarn layers together. The second warp yarn in each pair, ordinarily running between the top and bottom weft yarn layers and stacked below the first warp yarn, weaves over the top weft yarn skipped by the first warp yarn when it weaves down under a bottom weft yarn to maintain the plain-weave character of the top surface of the fabric. The second warp yarn never weaves with the bottom weft yarns. The fabric is flat-woven, and subsequently seamed into endless form. The first warp yarns have an exaggerated crimp to provide the fabric with an enhanced seam strength. The second warp yarns, having relatively little crimp, provide the fabric with an enhanced stretch resistance.


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