The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1995
Filed:
Jul. 15, 1993
Kiyofumi Kawamoto, Takarazuka, JP;
Masahiko Yoshimoto, Itami, JP;
Mitsubishi Electric Engineering Company Limited, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
The semiconductor test system comprises an OBIC measuring device (8) and a tester (5). The tester (5) transmits a test signal to an input pad (2a) of a semiconductor integrated circuit (1). In synchronization with this, the OBIC measuring device (8) irradiates drain regions (6) of the semiconductor integrated circuit (1) with a laser beam (7) one after another, to thereby detect the generation of the OBIC. An comparator (5c) in the tester (5) compares an output signal from an output pad (2b) of the semiconductor integrated circuit (1) and an OBIC detection signal from the OBIC measuring device (8) with expected values (5b).