The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1995
Filed:
Jan. 27, 1994
Martin A Parker, Penfield, NY (US);
Kenneth A Parulski, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A system which uses a random noise test target 16 to align sensors 10 and 12 by performing mathematical cross correlations between sensors 10 and 12. The system 48 includes a computer 58 rotating one of the images, computing a correlation between the rotated image and a reference image and determining the peak in the correlation. A global maximum is used to interpolate a true subpixel peak. The interpolated rotational cross correlation peak is used to determine values of two dimensional and rotational movement of one of the sensors 10 and 12 necessary to align the sensors. The values are used to move the sensor 10 or 12 and it is fixed in place. Once the sensors have been aligned and fixed in place, the system 118 computes the cross correlation of segments of the image to determine delay values and an interpolation filter coefficient values which are stored in a permanent storage device 120. The coefficients are used by an correction circuit 122 to correct for regional or spatially varying alignment errors during real time image processing by the imaging system.