The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 1995

Filed:

Aug. 15, 1994
Applicant:
Inventors:

Hiroyuki Makishita, Tokyo, JP;

Yukiyasu Takano, Tokyo, JP;

Toshiyuki Tezuka, Tokyo, JP;

Yasuhisa Kitajima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324754 ; 3241581 ; 324765 ; 348126 ;
Abstract

A TAB tester for recognizing image on or before testing the TAB so as to prevent erroneous detection. There are provided first, second and third image cameras. The second image camera is disposed upstream relative to a first sprocket, namely, at the front stage of measurement of a tape carrier and it takes a second image of the TAB and outputs a second image to an image processing unit. The third image camera is disposed downstream relative to a punch unit, namely, at the rear stage of the measurement of the tape carrier and it takes a third image of the TAB and outputs the third image to the image processing unit. The image processing unit converts the second and third images into second and third processed image data. The second processed image data is supplied to a control unit where it is stored as data of necessity of measurement of the TAB. The third processed image data is supplied to the control unit where the third processed image data is compared and collated with the second processed image data and a punching result by the punching unit.


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