The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1995
Filed:
Feb. 08, 1993
Tadahisa Nakazawa, Tokyo, JP;
Masahide Ogawa, Niigata, JP;
Kiyoshi Abe, Niigata, JP;
Kazuhiko Suzuki, Niigata, JP;
Takashi Tokita, Niigata, JP;
Toshio Ito, Niigata, JP;
Mizusawa Industrial Chemicals, Ltd., Tokyo, JP;
Abstract
Disclosed are amorphous silica or silica-alumina spherical particles composed of X-ray diffractometrically substantially amorphous silica or silica-alumina, wherein individual particles have a definite spherical shape and a notched surface, the circularity (A) represented by the following formula: ##EQU1## wherein r1 stands for the radius of the circumcircle of the profile of the particle in an electron microscope photo thereof and r2 stands for the radius of the inscribed circle of the profile of the particle in the electron microscope photo, is in the range of from 0.90 to 1, the notching degree (B) represented by the formula: ##EQU2## wherein .DELTA.t stands for the depth between the peak and trough in the radial direction of notches on the profile of the particle in the electron microscope photo and r1 is as defined above, is in the range of from 1 to 10%, and the primary particle size (2r1) determined by the electron microscope method is in the range of from 0.1 to 20 .mu.m.