The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1995
Filed:
Jul. 24, 1992
Jun Wu, Cambridge, MA (US);
Michael S Feld, Waban, MA (US);
Richard P Rava, Palo Alto, CA (US);
Firooz Partovi, Brookline, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
The present application is directed to the use of photon migration analysis to provide a method of analyzing the diffuse reflectance, fluorescence, Raman or other types of spectra obtained from tissue. This procedure provides a means for processing spectral data such that the distortion in fluorescence spectra, for example, caused by the interplay of a variety of factors such as scattering, absorption, geometry and boundary conditions, can be precisely removed simply by measuring the diffuse reflectance spectrum as well as a second selected spectrum, such as fluorescence, and adjust the spectrum with the reflectance spectrum as described herein. By this procedure, the sample-to-sample variability is minimized. The intrinsic spectrum extracted by this procedure can be easily deconvoluted and provide quantitative information about the physicochemical composition of tissue. Analytical procedures for clinical diagnosis have been developed based on this method.