The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 1995
Filed:
Dec. 18, 1992
Applicant:
Inventors:
David T Ino, Santa Clara, CA (US);
Patricia A Simonson, San Jose, CA (US);
Jeffrey A Techau, Sunnyvale, CA (US);
Richard H Larson, Los Gatos, CA (US);
Assignee:
Amdahl Corporation, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 223 ; 371 221 ;
Abstract
An apparatus and method for forcing stuck-at and transient errors at sequential and combinational logic and signal lines in a large scale data processing system. Error forcing is achieved by including a scan-in gate with error input and address lines for each scan point to be tested. A fault signal of adjustable duration is generated and combined in a unique fashion to an existing scan-in signal to permit either stuck-at or transient errors to be forced.