The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 1995
Filed:
May. 31, 1994
Hiroshi Tomiya, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
An apparatus and method for inspecting the appearance of a semiconductor device to easily judge the acceptability of the device with a simple structure. The apparatus comprises light-reflecting means and an optical reading mechanism. The light-reflecting means is disposed alongside of at least one side surface of the semiconductor device. The reading mechanism reads an image of the side surface reflected by the light-reflecting means and an image of the top or bottom surface of the device simultaneously. The method is initiated by placing the light-reflecting means alongside of at least one side surface of the device. Then, the optical reading mechanism reads an image of the side surface reflected by the light-reflecting means and an image of the top or bottom surface of the device simultaneously. The bending of each lead of the semiconductor device is inspected according to the images read by the reading mechanism.