The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 1995
Filed:
Jun. 27, 1994
Tadashi Mochizuki, Kawasaki, JP;
Yohichi Ishibashi, Kawasaki, JP;
Takanori Akiyoshi, Kawasaki, JP;
Yoshihito Iwata, Kawasaki, JP;
Satoshi Kinoshiro, Kawasaki, JP;
Akiko Sakashita, Kawasaki, JP;
NKK Corporation, Tokyo, JP;
Abstract
A method for analyzing solid sample comprises the steps of: introducing an inert carrier gas into a cell; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, the laser beam having a pulse half width of 0.001 .mu.sec or more, a pulse energy density of 0.001 GW/cm.sup.2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (.mu.g/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a retio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample;