The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 1995

Filed:

Apr. 30, 1993
Applicant:
Inventors:

Paul R Sorenson, San Diego, CA (US);

Keith E Cobbs, San Diego, CA (US);

Robert Beauchamp, Carlsbad, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J / ;
U.S. Cl.
CPC ...
347 37 ; 347 19 ; 347107 ;
Abstract

A test pattern for use with an optical sensor for an inkjet printer. The inventive pattern comprises a first plurality of vertical bars horizontally spaced and a second plurality of horizontal bars vertically spaced. The spacing between the bars is approximately equal to the width of the bars. In a particular implementation, the pattern is adapted for use with an inkjet printer having a plurality of pens. The first plurality of bars includes a first set of bars printed by each of the pens. The first plurality of bars includes a second set of bars printed by one of the pens moving at at least two different horizontal speeds. The second plurality of bars includes one column of vertically spaced bars for each of the pens. Each column of vertically spaced bars includes a first plurality of vertically spaced bars printed by a first pen. A respective column of vertically spaced bars includes a second plurality of vertically spaced bars printed by a respective one of the pens. Each column of vertically spaced bars includes a third plurality of vertically spaced bars printed by the first pen. The inventive pattern allows for considerable information with respect to pen alignments to be determined by optical scanning.


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