The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 1995

Filed:

Mar. 18, 1994
Applicant:
Inventor:

Gregory W Faris, Menlo Park, CA (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; A61B / ;
U.S. Cl.
CPC ...
250330 ; 128664 ; 2503581 ;
Abstract

A method and apparatus for direct two-dimensional transillumination imaging of a sample immersed in or including a scattering medium at infrared to near-infrared wavelengths. Frequency conversion and time-gating techniques in the infrared and near-infrared range are used to enhance two-dimensional image collection and detection. The apparatus includes a probe radiation source for applying a probe beam in the infrared to near-infrared frequency range to the sample. The probe beam is spread to cover a two-dimensionally extending area of the sample to be imaged. After interacting with the sample, the probe beam is representative of a two-dimensional image of the covered sample area. In one embodiment the apparatus includes a time-gating arrangement for selecting a temporal portion of the probe beam in a narrow time window representative of early arriving photons transmitted through the scattering medium and providing a time-gated beam representative of the two-dimensional image of the sample area. A reference beam interacts with a nonlinear medium to shift the frequency of the probe beam to a different frequency, which may lie outside the infrared to near-infrared range. In many applications of the apparatus the frequency will be shifted upward to a frequency higher than near-infrared. The nonlinear interaction occurs in such a manner so as not to destroy the two-dimensional image carrier by the time-gated beam. A detector operative at the shifted frequency detects the time-gated and frequency-shifted beam to directly record the two-dimensional image.


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