Test head manipulator

Abstract

A system is disclosed for positioning an electronic test head with respect to an electronic device handler. The positioner assembly includes separate locks which allow the test head to move vertically while preventing rotation of the test head about the main shaft. Thus, the test head can be aligned with the device handler, moved vertically away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. Alternatively, the separate locks allow the test head to rotate about the main shaft while preventing movement along the main shaft. Thus, the test head can be aligned with the device handler, rotated about the main shaft and away from the device handler while adjustments are made, and easily realigned with the device handler after adjustments have been completed. An index pin allows the test head to be rotated from an initial position to a temporary position and then rotated from the temporary position back to the initial position without requiring realignment of the test head relative to the device handler. The system includes a projected cradle assembly which allows the heavy test head to be projected above or below a physically large handler while still pivoting the load of the test head with its cable assembly at its center of gravity.