The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1995
Filed:
Nov. 06, 1992
David Keller, Albuquerque, NM (US);
University of New Mexico, Albuquerque, NM (US);
Abstract
An invention provides an arrangement for accomplishing three objects. The first is correcting distortions caused by probe geometry in probe microscope or profilometer data. The second is calculating apparent probe data from models. The third is deducing the shape of the probe tip from a standard or reference sample. The correction of distorted images data is done by mathematically placing one or more known or hypothetical tip surfaces at one or more points of the distorted image surface to provide a reconstructed surface, which is the envelope surface formed by all such tip surfaces. The calculation of probe microscope image data from one or more mathematical models of sample surfaces is done by mathematically placing one or more known or hypothetical inverted probe tip surface at one or more points on the mathematical model surface, and taking the image surface to be the envelope formed by all such tip surfaces. The deduction of probe tip shape from an image of a known standard or reference surface at one or more points of the image surface, and taking the probe tip surface to be the envelope of all such standard or reference surfaces.