The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1995
Filed:
Apr. 27, 1993
Applicant:
Inventors:
Soji Yamamoto, Tokyo, JP;
Takashi Nagano, Tokyo, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359368 ; 359372 ; 359391 ; 359393 ; 359384 ; 24834601 ;
Abstract
A microscope includes an observation optical system having at least an optical axis, an eyepiece unit, and an objective lens unit, and a frame for arranging the observation optical system thereon. The frame has a Y-shaped body, constituted by forming a first foot extending along the optical axis, a second foot extending along the optical axis, and a base located immediately under the optical axis to substantially form a Y shape within an installation surface, and an arm member connected to the Y-shaped body and having at least the eyepiece unit and the objective lens unit mounted thereon.