The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1995

Filed:

Feb. 25, 1994
Applicant:
Inventors:

Ehrhard Dammann, Jena, DE;

Juergen Bauer, Jena, DE;

Assignee:

Jenoptik GmbH, Jena, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 356358 ;
Abstract

A phase-modulated interferometer with novel control and signal processing utilizes superimposition signals capable of evaluation in a phase-modulated interferometer without complicated control of the phase modulator. A sinusoidal control signal with a modulation frequency (.omega..sub.0) having an amplitude (.psi..sub.0) is supplied to a known phase modulator. Multiplicative mixing of the superimposition signal produced in the interferometer from the measuring and reference arm with a sinusoidal signal of a determined mixing frequency (.omega..sub.M) which is rigidly coupled with respect to phase and frequency with the control signal is effected. When the amplitude (.psi..sub.0) of the control signal satisfies the condition for a suitable operating point of the phase modulator, a cosine signal conventionally used for evaluating the phase displacement is filtered out in an electronic bandpass filter at whose filter frequency (.omega..sub.F) the sum and difference frequencies of two harmonics of the modulation frequency (.omega..sub.0) and the mixing frequency (.omega..sub.M) assume the same value. The invention is applied in phase-modulated interferometers, in particular for precision distance measuring devices, preferably by the heterodyne evaluating method.


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