The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1995

Filed:

Dec. 22, 1993
Applicant:
Inventors:

Michel Nolf, Laroche, FR;

Patrick Chollet, Lannion, FR;

Paul Fossey, Tregastel, FR;

Assignee:

France Telecom, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 731 ; 356244 ;
Abstract

The invention relates to apparatus for measuring the index profile of an optical fiber preform that includes an outer envelope and a core. According to the invention, a deformable and transparent separation interface is provided between a deformable index isotropy medium and the outside surface of the envelope of the preform, said deformable separation interface adapting the deformable index isotropy medium to the outside surface of the envelope of the preform at least over an annular zone thereof, which zone corresponds to an optical measurement zone situated on the path of a light beam, said deformable and transparent interface, and inlet and outlet optical surfaces for the light beam all having an index close to the index of said medium.


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